METHODS FOR ENSURING RESISTANCE TO HCP FOR CONTROL LOGIC AND STATIC MEMORY OF THE MICROPROCESSOR IN THE DESIGN

Sergey V. Grechanyy; K. Chubur

doi:doi:10.12737/2219-0767-2020-12-4-17-24

UDC 62

METHODS FOR ENSURING RESISTANCE TO HCP FOR CONTROL LOGIC AND STATIC MEMORY OF THE MICROPROCESSOR IN THE DESIGN

Published в Modeling of systems and processes · Volume 12, Issue 4, 2020 · Pages 17–24 · Rubrics: Tehnicheskie nauki

DOI 10.12737/2219-0767-2020-12-4-17-24

Received: 23.01.2020 Accepted: 23.01.2020 Published: 23.01.2020

Authors

Sergey V. Grechanyy ¹ · K. Chubur ²

1 Voronezh State University of Forestry and Technologies named after G.F. Morozov

2 FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov
Russian Federation

ABSTRACT

The article describes methods for ensuring resistance to heavy charged particles (HCP) of the RAM block of the microprocessor. A description of the implementation and a block diagram of static memory based on dummy blocks is given. The paper considers methods of combating the biopolar effect, which are aimed at controlling the potential of the transistor body and reducing the resistance. The dependence of the critical charge of a SOI-memory cell the gain of a parasitic biopolar transistor is modeled. To increase the fault tolerance of combinational circuits consisting of control logic and decoder blocks, redundancy is applied at the level of individual valves.

KEYWORDS

heavy charged particles stability fault tolerance linear energy loss microprocessor static memory

Information References

Authors:

1. Voronezh State University of Forestry and Technologies named after G.F. Morozov

2. FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov

Russian Federation

Type:

Article

Pages:

from 17 to 24

Status:

Published

Subject area:

UDC 62

Language:

Russian

Keywords:

heavy charged particles, stability, fault tolerance, linear energy loss, microprocessor, static memory

References

1. Zol'nikov, V. K. Metodika proektirovaniya radiacionno-stoykih integral'nyh shem / V. K. Zol'nikov, V. N. Achkasov, V. P. Kryukov // Voprosy atomnoy nauki i tehniki. Seriya: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2004. - № 1-2. - S. 57-60.

2. Metody shemotehnicheskogo modelirovaniya KMOP SBIS s uchetom radiacii / K.V. Zol'nikov, V.A. Sklyar, V.I. Anciferova, S.A. Evdokimova // Voprosy atomnoy nauki i tehniki. Seriya: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2014. - № 2. - S. 5-9.

3. Modelirovanie vozdeystviya TZCh v aktivnyh oblastyah elementov mikroshem pri proektirovanii / K.V. Zol'nikov, V.A. Smerek, A.V. Achkasov, V.A. Sklyar // Modelirovanie sistem i processov. - 2014. - № 1. - S. 15-17.

4. Metody proektirovaniya sboeustoychivyh 8-razryadnyh mikrokontrollerov k vozdeystviyu TZCh / A.I. Yan'kov, V.A. Smerek, V.P. Kryukov, V.K. Zol'nikov, D.M. Utkin // Voprosy atomnoy nauki i tehniki. Seriya: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. - 2012. - № 4. - S. 73-79.

5. Zol'nikov, V. K. Prakticheskie metodiki vypolneniya verifikacii proektirovaniya mikroshem / V. K. Zol'nikov, S. A. Evdokimova, T. V. Skvorcova // Modelirovanie sistem i processov. - 2019. - T. 12, № 1. - S. 25-30.

6. Zebrev, G. I. Modelirovanie dozovyh i odinochnyh radiacionnyh effektov v kremnievyh mikro- i nanoelektronnyh strukturah dlya celey proektirovaniya i prognozirovaniya : dis. … d-ra tehn. nauk : 05.27.01 / G. I. Zebrev. - M., 2009. - 156 s.

7. Kryukov, V. P. Problemy modelirovaniya bazovyh elementov KMOP BIS dvoynogo naznacheniya v SAPR / V. P. Kryukov, K. V. Zol'nikov, S. A. Evdokimova // Modelirovanie sistem i processov. - 2013. - № 4. - S. 41-44.

8. Arzamascev, M. Yu.Analiz stoykosti k TZCh radiacionno-stoykogo mikrokontrollera 1874BE10T, vypolnennogo po otechestvennoy tehnologii 0.25 mkm / M. Yu. Arzamascev, A. I. Yan'kov // Modelirovanie sistem i processov. - 2018. - T. 11, № 1. - S. 4-9.

9. Obobschennaya metodika proektirovaniya tehnicheskih blokov vysokonadezhnyh programmno-tehnicheskih kompleksov special'nogo naznacheniya / V.K. Zol'nikov, D.M. Utkin, S.A. Evdokimova, V.I. Anciferova // Radiacionnaya stoykost' elektronnyh sistem «Stoykost'-2014» : sbornik tezisov dokladov 17-y Vserossiyskoy nauchno-prakticheskoy konferencii po radiacionnoy stoykosti elektronnyh sistem. - M. : Nacional'nyy issledovatel'skiy yadernyy universitet «MIFI», 2014. - S. 71-72.

10. Metody obespecheniya stoykosti mikroshem k odinochnym sobytiyam pri proektirovanii radiacionno-stoykih mikroshem / V. N. Achkasov, V. A. Smerek, D. M. Utkin, V. K. Zol'nikov // Problemy razrabotki perspektivnyh mikro- i nanoelektronnyh sistem (MES). - 2012. - № 1. - S. 634-637.

11. Yan'kov, A. I. Metodika funkcional'nogo kontrolya SBIS serii1874 na stoykost' k vozdeystviyu TZCh KP / A. I. Yan'kov, V. A. Smerek // Radiacionnaya stoykost' elektronnyh sistem «Stoykost'-2011» : sbornik materialov dokladov Rossiyskoy nauchnoy konferencii. - M. : Nacional'nyy issledovatel'skiy yadernyy universitet «MIFI». - 2011. - S. 182-184.

12. Smerek, V. K. Model' fizicheskih processov v elementah SBIS pri vozdeystvii tyazhelyh zaryazhennyh chastic / V. K. Smerek, V. K. Zol'nikov, K. I. Tapero // Modelirovanie sistem i processov. - 2010. - № 1-2. - S. 41-48.

13. Zol'nikov, V. K. Rezul'taty ispytaniy izdeliy k vozdeystviyu TZCh / V. K. Zol'nikov, V. A. Sklyar // Modelirovanie sistem i processov. - 2016. - T. 9, № 2. - S. 66-70.

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